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Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and structure of surface layers of materials. The applications of these techniques span environmental control, cultural heritage and conservation, materials and fusion technologies. The particle-induced gamma-ray emission (PIGE) spectroscopy technique in particular, is a powerful tool for detecting light elements in certain depths of surface layers. This publication describes the coordinated effort to measure and compile cross section data relevant to PIGE analysis and make these data available to the community of practice through a comprehensive online database.
Low Energy Particle Accelerator-Based Technologies and Their Applications describes types of low energy accelerators, presents some of the main manufacturers, illustrates some of the accelerator laboratories around the globe and shows examples of successful transfers of accelerators to needed laboratories. Key Features: Presents new trends and the state of the art in a field that's growing Provides an overview of numerous applications of such accelerators in medicine, industry, earth sciences, nuclear non-proliferation and oil Fills a gap, with the author drawing on his own experiences with transporting such relatively large machines from one lab to the other that require a tremendous amount of planning, technical and engineering efforts This is an essential reference for advanced students as well as for physicists, engineers and practitioners in accelerator science. About the Author Dr. Vladivoj (Vlado) Valković, a retired professor of physics, is a fellow of the American Physical Society and Institute of Physics (London). He has authored 22 books (from Trace Elements, Taylor & Francis, 1975, to Radioactivity in the Environment, Elsevier, 1st Edition 2001, 2nd Edition 2019), and more than 400 scientific and technical papers in the research areas of nuclear physics, applications of nuclear techniques to trace element analysis in biology, medicine and environmental research. He has lifelong experience in the study of nuclear reactions induced by 14 MeV neutrons. This research has been done through coordination and works on many national and international projects, including US-Croatia bilateral, NATO, IAEA, EU-FP5, FP6 and FP7 projects. Cover photo credit: 3SDH 1 MV Pelletron system with RF source and analysis endstation designed with the intended purpose of aiding in fusion research. It is capable of Ion Beam Analysis (IBA) techniques such as RBS, ERD, PIXE and NRA. Further detectors could be added to the endstation to allow for other techniques. Installed in Japan in 2014. Courtesy of National Electrostatics Corp.
The application of X-rays to objects of archaeology and insights into construction and chemical composition in a non-destructive manner date back to the discovery of radiation. This book contains measurement data taken with portable XRF and XRD, and data taken with accelerating ion beams and synchrotron radiations, and with their explanation.
/inca/publications/misc/creaghcov.htmAbout the coverThis book contains twenty chapters covering a wide range of research in the fields of scientific conservation of art and archaeometry. The common thread is the use of radiation in these analyses. The term "radiation" is used in the widest possible sense. The book encompasses the use of electromagnetic radiation in its microwave, infrared, visible, ultraviolet, x ray and &ggr; ray forms and the use of particulate forms such as electrons, neutrons and charged particles for which the Planck's Law relation applies. In many cases there is an interplay between the two forms: for example, proton induced x ray emission (PIXE), secondary ion mass spectrometry (SIMS). As far as possible the chapters have been arranged in order of ascending particle energy. Thus it commences with the use of microwaves and finishes with the use of &ggr; rays. The authors were chosen on the basis of their expertise as practitioners of their particular field of study. This means that, for example, the mature fields of study such as the IR and UV study of paintings have been written by senior researchers, whereas for the emerging fields of synchrotron and neutron techniques the chapters have been written by talented researchers at the commencement of their careers.
This book, like its first edition, addresses the fundamental principles of interaction between radiation and matter and the principle of particle detectors in a wide scope of fields, from low to high energy, including space physics and the medical environment. It provides abundant information about the processes of electromagnetic and hadronic energy deposition in matter, detecting systems, and performance and optimization of detectors. In this second edition, new sections dedicated to the following topics are included: space and high-energy physics radiation environment, non-ionizing energy loss (NIEL), displacement damage in silicon devices and detectors, single event effects, detection of slow and fast neutrons with silicon detectors, solar cells, pixel detectors, and additional material for dark matter detectors. This book will benefit graduate students and final-year undergraduates as a reference and supplement for courses in particle, astroparticle, and space physics and instrumentation. A part of it is directed toward courses in medical physics. The book can also be used by researchers in experimental particle physics at low, medium, and high energy who are dealing with instrumentation.
Reports on the outcome of an IAEA coordinated research project in the area of measurement and characterization of radioactive particles in the environment. This publication summarizes the achievements and findings of the project participants and gives guidance for application of the techniques for evaluation of contaminated areas.
The Handbook of Modern Ion Beam Materials Analysis, 2nd Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis and is an important reference tool for technicians, students and professionals. It is an excellent introduction to the fundamentals and lab practices of ion beam analysis and useful as a teaching text for undergraduate senior or first-year graduate students. It is the most recent and comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis.
Many archaeologists, as primarily social scientists, do not have a background in the natural sciences. This can pose a problem because they need to obtain chemical and physical analyses on samples to perform their research. This manual is an essential source of information for those students without a background in science, but also a comprehensive overview that those with some understanding of archaeological science will find useful. The manual provides readers with the knowledge to use archaeological science methods to the best advantage. It describes and explains the analytical techniques in a manner that the average archaeologist can understand, and outlines clearly the requirements, benefits, and limitations of each possible method of analysis, so that the researcher can make informed choices. The work includes specific information about a variety of dating techniques, provenance studies, isotope analysis as well as the analysis of organic (lipid and protein) residues and ancient DNA. Case studies illustrating applications of these approaches to most types of archaeological materials are presented and the instruments used to perform the analyses are described. Available destructive and non-destructive approaches are presented to help archaeologists select the most effective technique for gaining the target information from the sample. Readers will reach for this manual whenever they need to decide how to best analyze a sample, and how the analysis is performed.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)