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Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
As we have known, X-ray and related techniques are mainly used for quality control and materials characterization study. Most of the equipment used in these activities has contributed a lot to the advancement of materials science, solid state physics, chemistry, medical and other fields. In recent years, there have been a lot of improvements that includes the introduction of an array of software including instrument control, data interpretation and standard data that may provide quick results with enhanced efficiency. IXCRI 2014 aims to exchange and share experiences and research findings in all aspects of X-rays and related techniques among academics, researchers and the industry. Not only that, ICXRI 2014 includes a workshop session, which allows participants to gain a hands-on experience in learning fundamental understanding on X-ray applications. Due to this unique conference-workshop combination, I strongly believe that this conference will have a huge impact and will lead to future innovations and strong linkages among the participants. This is reflected in the number of participants, which amounts to a total of nearly 100 papers being presented here in this conference.
The 36 peer-reviewed papers cover mainly topics on X-ray and related research. Volume is indexed by Thomson Reuters CPCI-S (WoS)
While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major