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This book constitutes the proceedings of the 14th European Conference on Modelling Foundations and Applications, ECMFA 2018, held as part of STAF 2018, in Toulouse, France, in June 2018. The 19 papers presented in this volume were carefully reviewed and selected from 45 submissions. The cover topics such as (bidirectional and unidirectional) model transformations, model management, re-engineering, modelling environments, verification and validation, and domain-specific modelling w.r.t. business processes, automotive software, and safety-critical software.
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
The expression of uncertainty in measurement poses a challenge since it involves physical, mathematical, and philosophical issues. This problem is intensified by the limitations of the probabilistic approach used by the current standard (the GUM Instrumentation Standard). This text presents an alternative approach. It makes full use of the mathematical theory of evidence to express the uncertainty in measurements. Coverage provides an overview of the current standard, then pinpoints and constructively resolves its limitations. Numerous examples throughout help explain the book’s unique approach.
"This introduction to measurement uncertainty is intended for metrology professionals working in calibration laboratories and metrology institutes, as well as students in tertiary-level science and engineering programmes. The subject matter is presented with an emphasis on developing models of the physical measurement process. The level of mathematics and statistics used is basic and is typically covered by high school studies"--Distributor's website.
Literally an entire course between two covers, Measurement Uncertainty: Methods and Applications, Fourth Edition, presents engineering students with a comprehensive tutorial of measurement uncertainty methods in a logically categorized and readily utilized format. The new uncertainty technologies embodied in both U.S. and international standards have been incorporated into this text with a view toward understanding the strengths and weaknesses of both. The book is designed to also serve as a practical desk reference in situations that commonly confront an experimenter. The text presents the basics of the measurement uncertainty model, non-symmetrical systematic standard uncertainties, random standard uncertainties, the use of correlation, curve-fitting problems, and probability plotting, combining results from different test methods, calibration errors, and uncertainty propagation for both independent and dependent error sources. The author draws on years of experience in industry to direct special attention to the problem of developing confidence in uncertainty analysis results and using measurement uncertainty to select instrumentation systems.
Based on The International Metrology Congress meeting, this reference examines the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies; details the improvement of measurement procedures to guarantee the quality of products and processes; and discusses the development of metrology linked to innovating technologies. The themes of the Congress (quality and reliability of measurement, measurement uncertainties, calibration, verification, accreditation, sensory metrology, regulations and legal metrology) are developed either in a general way or applied to a specific economic sector or to a specific scientific field.
Maximizing reader insights into the key scientific disciplines of Machine Tool Metrology, this text will prove useful for the industrial-practitioner and those interested in the operation of machine tools. Within this current level of industrial-content, this book incorporates significant usage of the existing published literature and valid information obtained from a wide-spectrum of manufacturers of plant, equipment and instrumentation before putting forward novel ideas and methodologies. Providing easy to understand bullet points and lucid descriptions of metrological and calibration subjects, this book aids reader understanding of the topics discussed whilst adding a voluminous-amount of footnotes utilised throughout all of the chapters, which adds some additional detail to the subject. Featuring an extensive amount of photographic-support, this book will serve as a key reference text for all those involved in the field.
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.