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A basic guide to the techniques and skills required to select, set up and use a scanner. Beginning with the basics, readers will learn how to prepare an image for scanning, and learn how to calculate the proper resolution for the scan. The book then moves on to more advanced subjects but all the material is presented in a jargon-free style and even the computer-illiterate will find themselves making great scans in no time at all. Illustrated throughout.
One of the main concerns for digital photographers today is asset management: how to file, find, protect, and re-use their photos. The best solutions can be found in The DAM Book, our bestselling guide to managing digital images efficiently and effectively. Anyone who shoots, scans, or stores digital photographs is practicing digital asset management (DAM), but few people do it in a way that makes sense. In this second edition, photographer Peter Krogh -- the leading expert on DAM -- provides new tools and techniques to help professionals, amateurs, and students: Understand the image file lifecycle: from shooting to editing, output, and permanent storage Learn new ways to use metadata and key words to track photo files Create a digital archive and name files clearly Determine a strategy for backing up and validating image data Learn a catalog workflow strategy, using Adobe Bridge, Camera Raw, Adobe Lightroom, Microsoft Expression Media, and Photoshop CS4 together Migrate images from one file format to another, from one storage medium to another, and from film to digital Learn how to copyright images To identify and protect your images in the marketplace, having a solid asset management system is essential. The DAM Book offers the best approach.
Identifies seven personality types that share a common quality of having numerous unrelated interests, explaining how to prioritize and pursue multiple goals simultaneously in order to enjoy a successful and varied life.
Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an
With the invention of the scanning tunneling microscope in 1982 by Binnig and Rohrer and the subsequent award of the Nobel Prize, the field of scan ning microscopy was given a strong boost in view of its wide range of ap plications. In particular, expanding the capability to access nature's foundations at the atomic level is now recognized as having the potential for major impact in Infonnation Technology. This third volume of the ESPRIT Basic Research Series provides a well structured overview of the state of the art of scanning microscopy and re cent advances including results of ESPRIT Basic Research Actions 3109 and 3314. April 1992 G. Metakides Preface The IMO Symposium Fall '90, Wetzlar, FRO, October 1/2, 1990, brought together leading scientists and researchers in scanning microscopy from re search institutes and industries, each of whom was invited to contribute a lecture which was followed by a discussion. The resulting contributions are contained in this proceedings. Microscopic techniques are used not only for research work in material and life science but also for routine applications in almost any vital section of our everyday life. The demand for coming to a better understanding of materials and their behaviour under different conditions and environments as well as all aspects of human life initiated an ongoing development for improved microscopic techniques.
Because of its simplicity of use and quantitative results, Scanning Electrochemical Microscopy (SECM) has become an indispensable tool for the study of surface reactivity. The fast expansion of the SECM field over several years has been fueled by the introduction of new probes, commercially available instrumentation, and new practical applications. Scanning Electrochemical Microscopy, Third Edition offers essential background and in-depth overviews of specific applications in self-contained chapters. The vitality and growing popularity of SECM over the past 30+ years have largely been determined by its versatility and capability to remain useful in the changing scientific and technological environments. New applications reported during the last decade reflect significant current activity in biomedical and energy-related research. This thoroughly updated edition provides up-to-date comprehensive reviews of different aspects of SECM. New chapters by renowned professionals in the field cover recent advances in different areas of SECM including nanoSECM, surface reactions and films, batteries, and fuel cells. Expanded coverage of electrocatalysis and surface interrogation as well as photoelectrochemistry and photoelectrocatalysis are also provided. Useful for a broad range of interdisciplinary research—from biological systems to nanopatterning—this book is invaluable to all interested in learning and applying SECM.
The Nmap 6 Cookbook provides simplified coverage of network scanning features available in the Nmap suite of utilities. Every Nmap feature is covered with visual examples to help you quickly understand and identify proper usage for practical results.Topics covered include:* Installation on Windows, Mac OS X, and Unix/Linux platforms* Basic and advanced scanning techniques* Network inventory and auditing* Firewall evasion techniques* Zenmap - A graphical front-end for Nmap* NSE - The Nmap Scripting Engine* Ndiff - The Nmap scan comparison utility* Ncat - A flexible networking utility* Nping - Ping on steroids
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.